Applicability of metrology to information technology
نویسندگان
چکیده
منابع مشابه
Applicability of Metrology to Information Technology
National Institute of Standards and Technology, Gaithersburg, MD 20899-0001, In 1959 the Director of the National Bureau of Standards declared “The emergence of science and technology as the paramount concern of the Nation in the 20 century . . . demanded the highest order of measurement competence, in order to provide the standards and measurement techniques on which maintenance of scientific ...
متن کاملDesigning the Framework of the Premium Information Technology Award of the National Information Technology Conference Managers
Objectives: The National Conference of Information Technology Managers is conceivably the most significant of its nature in the country. Chief competitive advantage to comparable ones is its observant of products in IT as an alternative to papers. The purpose is a comprehensive design for the scientific evaluation of information technology products. Method: For the evaluation plan of the premiu...
متن کاملThe impact of information technology on health
Information Technology (IT) is the study of systems especially computers for storing, retrieving, and sending information. It uses any networking and other physical devices, infrastructures to secure and exchange all forms of electronic data. IT is used globally as a major portion of daily life and we use it nearly every day within organizations for many reasons. Our computers, mobile phones an...
متن کاملVacuum Technology Considerations For Mass Metrology
Vacuum weighing of mass artifacts eliminates the necessity of air buoyancy correction and its contribution to the measurement uncertainty. Vacuum weighing is also an important process in the experiments currently underway for the redefinition of the SI mass unit, the kilogram. Creating the optimum vacuum environment for mass metrology requires careful design and selection of construction materi...
متن کاملThe relationship between microsystem technology and metrology
Microsystem technology (MST) has enabled silicon sensors to evolve from simple transduction elements to microsystems (micro-instruments) that include readout circuits, self-test, and auto-zeroing facilities. This paper discusses the impact of MST in the instrumentation and measurement (I&M) field. In metrology, in particular, the development of electrical reference standards by using microtechn...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 1999
ISSN: 1044-677X
DOI: 10.6028/jres.104.035